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document
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Barends, R. (author), Hortensius, H.L. (author), Zijlstra, T. (author), Baselmans, J.J.A. (author), Yates, S.J.C. (author), Gao, J.R. (author), Klapwijk, T.M. (author)
We study NbTiN resonators by measurements of the temperature dependent resonance frequency and frequency noise. Additionally, resonators are studied covered with SiOx dielectric layers of various thicknesses. The resonance frequency develops a nonmonotonic temperature dependence with increasing SiOx layer thickness. The increase in the noise is...
journal article 2008
Source URL (retrieved on 2024-06-07 06:27): https://repository.tudelft.nl/islandora/search/%20?collection=research&display=tud_default&f%5B0%5D=mods_name_personal_author_namePart_family_ss%3A%22Klapwijk%22&f%5B1%5D=mods_name_personal_author_namePart_family_ss%3A%22Zijlstra%22&f%5B2%5D=mods_subject_topic_ss%3A%22silicon%5C%20compounds%22