-
document
-
Tans, S.J. (author), Miedema, R. (author), Geerligs, L.J. (author), Dekker, C. (author), Wu, J. (author), Wegner, G. (author) journal article 1997
Source URL (retrieved on 2024-05-24 14:56): https://repository.tudelft.nl/islandora/search/subject%3A%22Atomic%255C%252Bforce%255C%252Bmicroscopy%22?collection=research&f%5B0%5D=mods_subject_topic_ss%3A%22A7340C%5C%20Contact%5C%20resistance%2C%5C%20contact%5C%20potential%2C%5C%20and%5C%20work%5C%20functions%22&f%5B1%5D=mods_subject_topic_ss%3A%22imaging%22&f%5B2%5D=mods_subject_topic_ss%3A%22A7360F%5C%20Electronic%5C%20properties%5C%20of%5C%20semiconductor%5C%20thin%5C%20films%22&f%5B3%5D=mods_subject_topic_ss%3A%22electrical%5C%20contacts%22&f%5B4%5D=mods_subject_topic_ss%3A%22organic%5C%20semiconductors%22