Gate Set Tomography Under the Influence of Time-Correlated Noise
V.J. van Wieringen (TU Delft - Electrical Engineering, Mathematics and Computer Science)
B.M. Terhal – Graduation committee member (TU Delft - Discrete Mathematics and Optimization)
Maximilian Russ – Graduation committee member (TU Delft - QCD/Rimbach-Russ)
Sebastian Feld – Graduation committee member (TU Delft - QCD/Feld Group)
More Info
expand_more
Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.
Abstract
This thesis investigates the robustness of Gate Set Tomography (GST) under the influence of time-correlated (non-Markovian) noise. GST is a widely used protocol for characterizing quantum gates, yet its efficacy traditionally relies on the assumption of Markovian noise, where errors are memoryless. This research challenges this assumption by introducing non-Markovian noise into simulated GST experiments using a custom-developed Python library. The study com- pares baseline GST performance under Markovian noise with GST results un- der various non-Markovian noise conditions. The findings highlight significant discrepancies in GST’s error reporting and reveal a distinct trade-off between GST’s accuracy and consistency in practical, non-Markovian settings. This work contributes to the broader understanding of error characterization in quantum computing and provides a robust framework for future studies in quantum gate fidelity under realistic noise conditions.
Files
File under embargo until 07-07-2026