A new sharpness measure based on Gaussian lines and edges
Conference Paper
(2002)
Author(s)
J Dijk (TU Delft - ImPhys/Quantitative Imaging)
M van Ginkel (TU Delft - ImPhys/Quantitative Imaging)
RJ van Asselt (External organisation)
Lucas J. Van Vliet (TU Delft - ImPhys/Quantitative Imaging)
PW Verbeek (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:02a9f97d-e921-4971-968e-2bc59b0d5596
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Publication Year
2002
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
39-43
ISBN (print)
90-803086-6-8
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