A Defect- and Fault-Tolerant Architecture for Nanocomputers
Journal Article
(2003)
Author(s)
J Han (TU Delft - ImPhys/Quantitative Imaging)
P.P. Jonker (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:02b98282-9ec5-4ec0-8567-11f1394c3f27
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Publication Year
2003
Research Group
ImPhys/Quantitative Imaging
Issue number
2
Volume number
14
Pages (from-to)
224-230
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