Surface-charge-layer sheet-resistance measurements for evaluating interface RF losses on high-resistivity-silicon substrates
Journal Article
(2012)
Author(s)
S.B. Evseev (TU Delft - Electronic Components, Technology and Materials)
L.K. Nanver (TU Delft - Electronic Components, Technology and Materials)
S Milosaviljevic (External organisation)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/TMTT.2012.2215050
To reference this document use:
https://resolver.tudelft.nl/uuid:044bcb07-ab0b-4fcf-81f4-3f16feaa970f
More Info
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Publication Year
2012
Language
English
Research Group
Electronic Components, Technology and Materials
Issue number
11
Volume number
60
Pages (from-to)
3542-3550
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