Detecting and locating light atoms from high-resolution STEM images

The quest for a single optimal design

Journal Article (2016)
Author(s)

J. Gonnissen (Universiteit Antwerpen)

A. De Backer (Universiteit Antwerpen)

A.J. Den Dekker (Universiteit Antwerpen, TU Delft - Team Michel Verhaegen)

J. Sijbers (Universiteit Antwerpen)

S. Van Aert (Universiteit Antwerpen)

Research Group
Team Michel Verhaegen
Copyright
© 2016 J. Gonnissen, A. De Backer, A.J. den Dekker, J. Sijbers, S. Van Aert
DOI related publication
https://doi.org/10.1016/j.ultramic.2016.07.014
More Info
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Publication Year
2016
Language
English
Copyright
© 2016 J. Gonnissen, A. De Backer, A.J. den Dekker, J. Sijbers, S. Van Aert
Research Group
Team Michel Verhaegen
Volume number
170
Pages (from-to)
128-138
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Abstract

In the present paper, the optimal detector design is investigated for both detecting and locating light atoms from high resolution scanning transmission electron microscopy (HR STEM) images. The principles of detection theory are used to quantify the probability of error for the detection of light atoms from HR STEM images. To determine the optimal experiment design for locating light atoms, use is made of the so-called Cramér–Rao Lower Bound (CRLB). It is investigated if a single optimal design can be found for both the detection and location problem of light atoms. Furthermore, the incoming electron dose is optimised for both research goals and it is shown that picometre range precision is feasible for the estimation of the atom positions when using an appropriate incoming electron dose under the optimal detector settings to detect light atoms.

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