Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields.

Journal Article (2001)
Author(s)

J van de Weijer (External organisation)

Lucas Van Vliet (TU Delft - ImPhys/Quantitative Imaging)

Piet Verbeek (TU Delft - ImPhys/Quantitative Imaging)

M van Ginkel (TU Delft - ImPhys/Quantitative Imaging)

Research Group
ImPhys/Quantitative Imaging
More Info
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Publication Year
2001
Research Group
ImPhys/Quantitative Imaging
Issue number
9
Volume number
23
Pages (from-to)
1035-1042

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