Angular scaling of critical current measurements on laser-ablated YBa2Cu3O7-δ thin films

Journal Article (1994)
Author(s)

G. Ravi Kumar (Bhabha Atomic Research Centre, Vrije Universiteit Amsterdam)

M. R. Koblischka (Vrije Universiteit Amsterdam)

J.C. Martinez (Vrije Universiteit Amsterdam)

Ronald Griessen (Vrije Universiteit Amsterdam)

Bernard Dam (Vrije Universiteit Amsterdam)

Jan H. Rector (Vrije Universiteit Amsterdam)

Affiliation
External organisation
DOI related publication
https://doi.org/10.1016/0921-4534(94)91053-7
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Publication Year
1994
Language
English
Affiliation
External organisation
Issue number
PART 5
Volume number
235-240
Pages (from-to)
3053-3054

Abstract

Orientation dependent measurements of torque hysteresis loops on high quality laser-ablated YBa2Cu3O7-δ thin films were performed at a temperature of 30 K in magnetic fields up to 7 T. From these measurement we extract the field and orientation dependence of the in-plane critical current density Js(H,θ), where θ is the angle between the applied external magnetic field H and the plane of the film. Following the scaling arguments of Blatter, Geshkenbein and Larkin based on the anisotropic Ginzburg-Landau theory, we have been able to scale the measured Js(H, θ) into a form ∫(ε{lunate}(θ)H), where ε{lunate} (θ) = (sin2 θ + cos2 θ/gg2) 1 2 with γ = 3.4±0.3. The obtained value of the anisotropy parameter γ is much smaller than the values reported earlier for single crystals close to Tc.

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