A testing set-up for a micro-analysis positron beam facility.
Journal Article
(1999)
Author(s)
LV Jorgensen (TU Delft - ImPhys/Charged Particle Optics)
AHV van Veen (TU Delft - ImPhys/Charged Particle Optics)
H. Schut (TU Delft - Old - Section Defects in Materials)
A.J.M. Winkelman (TU Delft - Old - Section Reactor Physics)
P. Kruit (TU Delft - ImPhys/Charged Particle Optics)
Research Group
ImPhys/Charged Particle Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:0eca55a7-e06d-454f-846f-a8aa016b37ff
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Publication Year
1999
Research Group
ImPhys/Charged Particle Optics
Volume number
427
Pages (from-to)
131-135
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