In-situ Scanning Transmission X-ray Microscopy of catalytic materials under reaction conditions
Conference Paper
(2009)
Author(s)
E Smit (External organisation)
JF Creemer (TU Delft - Electronic Components, Technology and Materials)
HW Zandbergen (QN/High Resolution Electron Microscopy)
BM Weckhuysen (External organisation)
FMF de Groot (External organisation)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:0f641429-a7d6-470d-9489-516b109d8aec
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Publication Year
2009
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-4
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