Study of Si/SiO-2 interface using positrons: present status and prospects
Book Chapter
(1998)
University
Delft University of Technology
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https://resolver.tudelft.nl/uuid:0f65ba89-273f-48c3-9ad1-adfe63281257
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Publication Year
1998
University
Delft University of Technology
Pages (from-to)
25-38
ISBN (print)
0-7923-5007
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