Characterization of ultra-shallow gate n-channel JFETs

Piccolo, G; Vandamme, LK; Macucci, M; Nanver, L. K.

Characterization of ultra-shallow gate n-channel JFETs

Conference paper (2007)

Authors

G Piccolo Old - EWI Sect. ECTM

LK Vandamme External organisation

M Macucci External organisation

L. K. Nanver Electronic Components, Technology and Materials

Research Group

Old - EWI Sect. ECTM

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Published Date

2007

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Research Group

Old - EWI Sect. ECTM

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