Characterization of ultra-shallow gate n-channel JFETs
Conference Paper
(2007)
Author(s)
G Piccolo (TU Delft - Old - EWI Sect. ECTM)
LK Vandamme (External organisation)
M Macucci (External organisation)
L.K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Old - EWI Sect. ECTM
To reference this document use:
https://resolver.tudelft.nl/uuid:120c6d4a-2885-4602-89e4-7586d2f377e0
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Publication Year
2007
Research Group
Old - EWI Sect. ECTM
Pages (from-to)
1-4
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