Characterization of ultra-shallow gate n-channel JFETs

Conference paper (2007)

Authors

G Piccolo Old - EWI Sect. ECTM
LK Vandamme External organisation
M Macucci External organisation
L.K. Nanver Electronic Components, Technology and Materials - EEMCS
Research Group
Old - EWI Sect. ECTM
More Info
expand_more

Published Date

2007

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Old - EWI Sect. ECTM