TEM/SEM investigation of microstructural changes within the white etching area under rolling contact fatigue and 3-D crack reconstruction by focused ion beam

Journal article (2007)

Authors

A Grabulov QN/High Resolution Electron Microscopy
U. Ziese QN/High Resolution Electron Microscopy
H.W. Zandbergen QN/High Resolution Electron Microscopy
Research Group
QN/High Resolution Electron Microscopy
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Published Date

2007

Language

Undefined/Unknown

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Research Group

QN/High Resolution Electron Microscopy