Effect of Electron Beam Parameters on Simulated CBED Patterns from Edge-on Grain Boundaries.
Journal Article
(2000)
Author(s)
RMJ Bokel (TU Delft - OLD Virtual Materials and Mechanics)
F. D. Tichelaar (TU Delft - OLD Virtual Materials and Mechanics)
FW Schapink (TU Delft - OLD Virtual Materials and Mechanics)
Research Group
OLD Virtual Materials and Mechanics
To reference this document use:
https://resolver.tudelft.nl/uuid:14f64118-03e1-4214-8105-d532fde13420
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Publication Year
2000
Research Group
OLD Virtual Materials and Mechanics
Volume number
197
Pages (from-to)
55-59
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