Robust fault detection with statistical uncertainty in identified parameters

Journal Article (2012)
Author(s)

J Dong (TU Delft - Electronic Components, Technology and Materials)

M. Verhaegen (TU Delft - DISC)

M Gustafsson (External organisation)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/TSP.2012.2208638
More Info
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Publication Year
2012
Language
English
Research Group
Electronic Components, Technology and Materials
Issue number
10
Volume number
60
Pages (from-to)
5064-5076

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