A new sharpness measure based on Gaussian lines and edges
Journal Article
(2003)
Author(s)
J Dijk (TU Delft - ImPhys/Quantitative Imaging)
M van Ginkel (TU Delft - ImPhys/Quantitative Imaging)
RJ van Asselt (External organisation)
Lucas J. Van Vliet (TU Delft - ImPhys/Quantitative Imaging)
PW Verbeek (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:1778697f-0d79-40e3-abef-09aa0e2cbd9c
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Publication Year
2003
Research Group
ImPhys/Quantitative Imaging
Volume number
2756
Pages (from-to)
149-156
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