Inaccuracies in the dielectric permittivity due to thickness variation
Conference Paper
(2014)
Author(s)
R Kochetov (TU Delft - Old - EWI-ESE-DC&S DC systems & Storage)
Alex Tsekmes (TU Delft - Old - EWI-ESE-DC&S DC systems & Storage)
P.H.F. Morshuis (TU Delft - Old - EWI-ESE-DC&S DC systems & Storage)
J. J. Smit (TU Delft - Electrical Engineering, Mathematics and Computer Science)
Research Group
Old - EWI-ESE-DC&S DC systems & Storage
DOI related publication
https://doi.org/10.1109/EIC.2014.6869346
To reference this document use:
https://resolver.tudelft.nl/uuid:184b527c-a313-42dc-bf44-7146d6beccd1
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Publication Year
2014
Language
English
Research Group
Old - EWI-ESE-DC&S DC systems & Storage
Pages (from-to)
55-58
ISBN (print)
978-1-4799-2787-6
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