Heterointerface effects on the charging energy of shallow D- Ground state in silicon: Role of dielectric mismatch

Journal Article (2010)
Author(s)

M.J. Calderon (External organisation)

J. Verduijn (TU Delft - QN/Photronic Devices)

GP Lansbergen (TU Delft - QN/Photronic Devices)

GC Tettamanzi (TU Delft - QN/Photronic Devices)

S. Rogge (TU Delft - QN/Photronic Devices)

B Koiller (External organisation)

Research Group
QN/Photronic Devices
More Info
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Publication Year
2010
Language
English
Research Group
QN/Photronic Devices
Issue number
075317
Volume number
82

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