Heterointerface effects on the charging energy of shallow D- Ground state in silicon: Role of dielectric mismatch
Journal Article
(2010)
Author(s)
M.J. Calderon (External organisation)
J. Verduijn (TU Delft - QN/Photronic Devices)
GP Lansbergen (TU Delft - QN/Photronic Devices)
GC Tettamanzi (TU Delft - QN/Photronic Devices)
S. Rogge (TU Delft - QN/Photronic Devices)
B Koiller (External organisation)
Research Group
QN/Photronic Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:1a2e1106-2d42-4b8c-8f10-34c47ef02401
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Publication Year
2010
Language
English
Research Group
QN/Photronic Devices
Issue number
075317
Volume number
82
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