Growth and characterization of single crystal Si and dielectric thin films for large area applications: progress report December 2000

Report (2000)

Authors

C.I.M. Beenakker Electronic Components, Technology and Materials - EEMCS
H Wallinga External organisation
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2000

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials