Quality factor of thin-film Fabry-Perot resonators: dependence on interface roughness
Conference Paper
(1999)
Author(s)
M Bartek (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
I Novotny (External organisation)
José H. Correia (External organisation)
V Tvarozek (External organisation)
Research Group
Old - EWI Ch. Integrated Sensing Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:1fb855f6-9aa8-4f58-ad75-f1adeaf46560
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Publication Year
1999
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
523-526
ISBN (print)
90-76699-02-X
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