Recent Developments in Orientation Contrast Microscopy

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Recent Developments in Orientation Contrast Microscopy

Book Chapter (2021)

Author(s)

Hadi Pirgazi (TU Delft - Mechanical Engineering, Universiteit Gent)

Roumen H. Petrov (Universiteit Gent, TU Delft - Mechanical Engineering)

Loïc Malet (Vrije Universiteit Brussel)

Stéphane Godet (Vrije Universiteit Brussel)

Leo A.I. Kestens (TU Delft - Mechanical Engineering, Universiteit Gent)

Research Group

Team Kevin Rossi

Electron diffraction ACOM-TEM Transmission Kikuchi diffraction (TKD Focused ion beam tomography 3D microstructure Serial sectioning ) Three-dimensional Electron Back Scattering Diffraction (3D-EBSD) Orientation contrast microscopy

DOI related publication

https://doi.org/10.1016/B978-0-12-819726-4.00135-6 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:1fd81f9b-6ad1-495b-8b94-54b3a3a34844

More Info

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Publication Year

2021

Language

English

Research Group

Team Kevin Rossi

Pages (from-to)

662-681

Publisher

Elsevier

ISBN (print)

9780128197332

ISBN (electronic)

9780128197264

Downloads counter

161

Abstract

Automated mapping of crystallographic orientations based on the diffraction of electrons has been widely employed to characterize the microstructure of crystalline materials. The most commonly used technique in this field is Electron Backscatter Diffraction (EBSD), which is a scanning electron microscopy based technique. Modern EBSD owes its popularity to the fact that it offers a reasonable balance between spatial resolution (30–50 nm) and field width (~mm2). This article highlights a number of new developments and applications of orientation contrast microscopy including (1) 3D-EBSD, (2) Transmission Kikuchi Diffraction (TKD) and (3) ACOM-TEM (Automatic Crystal Orientation Mapping in the TEM)