Thickness measurement of CT- imaged objects

Conference paper (1999)

Authors

G de Vries ImPhys/Quantitative Imaging
P.W. Verbeek ImPhys/Quantitative Imaging
U Stelwagen External organisation
Research Group
ImPhys/Quantitative Imaging
More Info
expand_more

Published Date

1999

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

ImPhys/Quantitative Imaging