Thickness measurement of CT- imaged objects
Conference Paper
(1999)
Author(s)
G de Vries (TU Delft - ImPhys/Quantitative Imaging)
P.W. Verbeek (TU Delft - ImPhys/Quantitative Imaging)
U Stelwagen (External organisation)
Research Group
ImPhys/Quantitative Imaging
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https://resolver.tudelft.nl/uuid:1fe18b1d-27a1-4e48-b938-13b26b290767
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Publication Year
1999
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
179-183
ISBN (print)
90-83086-4-1
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