Gamma processes and peaks-over-threshold distributions for time-dependent reliability

Journal article (2007)

Authors

JM van Noortwijk OLD Operations Research and Risk Analysis

J.A.M. van der Weide Applied Probability -

MJ Kallen OLD Operations Research and Risk Analysis

MD Pandey OLD Operations Research and Risk Analysis

Research Group

OLD Operations Research and Risk Analysis

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Published Date

2007

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Research Group

OLD Operations Research and Risk Analysis