Comparison of Si and Ge low-loss spectra to interpret the Ge contrast in EFTEM images of Si1-xGex nanostructures
Journal Article
(2006)
Author(s)
R Pantel (External organisation)
MC Cheynet (External organisation)
Frans Tichelaar (QN/High Resolution Electron Microscopy)
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Publication Year
2006
Issue number
7
Volume number
37
Pages (from-to)
657-665
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