Population inversion of Landau levels in the valence band of Silicon in crossed electric and magnetic fields

Journal article (1998)

Authors

AV Muravjov External organisation
RC Strijbos Old - sect Terahertz Imaging (IST/TI)
WT Wenckebach Old - sect Terahertz Imaging (IST/TI)
VN Shastin External organisation
Research Group
Old - sect Terahertz Imaging (IST/TI)
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Published Date

1998

Language

Undefined/Unknown

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Research Group

Old - sect Terahertz Imaging (IST/TI)