Statistiscal fault detection and identification with robustness to uncertain parameters identified from closed-loop data
Journal Article
(2010)
Author(s)
J Dong (TU Delft - Electronic Components, Technology and Materials)
M. Verhaegen (TU Delft - DISC)
M Gustafsson (External organisation)
Research Group
Electronic Components, Technology and Materials
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Publication Year
2010
Research Group
Electronic Components, Technology and Materials
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