Optical degradation mechanisms and accelerated reliability evaluation for LEDs

Doctoral thesis (2016)

Authors

J. Huang Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
Copyright: © 2016 J. Huang
DOI: https://doi.org/10.4233/uuid:299c48c9-5bc7-4c5a-aab8-1b82696fbb5b
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Published Date

2016

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials