Optical degradation mechanisms and accelerated reliability evaluation for LEDs
Doctoral Thesis
(2016)
Author(s)
Jianlin Huang (TU Delft - Electrical Engineering, Mathematics and Computer Science)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.4233/uuid:299c48c9-5bc7-4c5a-aab8-1b82696fbb5b
Final published version
To reference this document use
https://doi.org/10.4233/uuid:299c48c9-5bc7-4c5a-aab8-1b82696fbb5b
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Publication Year
2016
Language
English
Research Group
Electronic Components, Technology and Materials
ISBN (print)
978-94-028-0296-2
Downloads counter
223
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Institutional Repository
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