Characteristics of a PSD range image sensor fabricated in a standard bipolar process
Conference Paper
(1997)
Author(s)
M de Bakker (TU Delft - ImPhys/Quantitative Imaging)
FR Boddeke (TU Delft - ImPhys/Quantitative Imaging)
PW Verbeek (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
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https://resolver.tudelft.nl/uuid:2ad68ee9-5f5e-449c-b33b-1fbeb9266760
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Publication Year
1997
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
42-48
ISBN (print)
90-803086-2-5
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