Efficient residual stress identification approach for MEMS using modal information

Conference Paper (2016)
Author(s)

R.J. Dedden (TU Delft - Computational Design and Mechanics)

L. Iapichino (TU Delft - Computational Design and Mechanics)

P Tiso (ETH Zürich)

J.F.L. Goosen (TU Delft - Computational Design and Mechanics)

Fred van Van Keulen (TU Delft - Computational Design and Mechanics)

Research Group
Computational Design and Mechanics
More Info
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Publication Year
2016
Language
English
Research Group
Computational Design and Mechanics
Pages (from-to)
2169-2181
ISBN (electronic)
9789073802940

Abstract

Residual stresses are common in Micro Electro Mechanical System (MEMS) membrane structures. Experimental assessment of these stresses can provide valuable information on the production process. In general, experimental stress assessment for MEMS is challenging due to the limited possibilities for non-destructive testing. This work investigates the use of dynamic modal data to identify the residual stress state. In view of the computational feasibility, the focus is on two aspects: 1) A method is proposed that expresses the unknown stress field as a combination of few, carefully selected stress modes. An optimization algorithm is deemed to identify the amplitudes of such modes. 2) A meta-model is constructed using the empirical interpolation method (EIM), to facilitate a fast evaluation of the iterations.

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