Life prediction for epoxy resin insulated transformer windings through accelerated aging tests

Conference paper (2010)

Authors

Q. Zhuang OLD High-Voltage Technology and Management
P.H.F. Morshuis OLD High-Voltage Technology and Management
X Chen OLD High-Voltage Technology and Management
S. Meijer OLD Electrical Power Systems , OLD High-Voltage Technology and Management
J.J. Smit OLD High-Voltage Technology and Management
Z Xu OLD High-Voltage Technology and Management
Research Group
OLD High-Voltage Technology and Management
More Info
expand_more

Published Date

2010

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

OLD High-Voltage Technology and Management

Abstract

This investigation aims to perform a probabilistic prediction of the lifetime of epoxy resin insulation of transformer windings. To support the prediction, several accelerated electrical aging tests were conducted at different voltage levels on epoxy resin insulated transformer winding specimens. The lifetimes achieved from the tests show a ¿flat z-shaped¿ V-t (voltage vs. lifetime) curve and indicate the well known threshold stress effect. Since the operation stress is in the convex part of the V-t curve, the life exponent n was not predetermined, but estimated from a data pool obtained at the lowest voltage levels. As a result, the operation life and its confidence intervals were predicted from the breakdown data at these low voltage levels.