Atomic-scale electron microscopy at ambient pressure
Journal Article
(2008)
Author(s)
JF Creemer (TU Delft - Old - EWI Sect. ECTM)
S Helveg (External organisation)
GH Hoveling (External organisation)
S Ullmaan (External organisation)
AM Molenbroek (External organisation)
Pasqualina M Sarro (TU Delft - Electronic Components, Technology and Materials)
Henny W. Zandbergen (QN/High Resolution Electron Microscopy)
Research Group
Old - EWI Sect. ECTM
To reference this document use:
https://resolver.tudelft.nl/uuid:2e807f72-7c18-4aa7-b68d-937f16b25b5f
More Info
expand_more
expand_more
Publication Year
2008
Research Group
Old - EWI Sect. ECTM
Volume number
108
Pages (from-to)
993-998
No files available
Metadata only record. There are no files for this record.