Broadband coherent Fourier scatterometry: A two-pulse approach
T.A. van der Sijs (TU Delft - ImPhys/El Gawhary group)
Jila Rafigh Doost (TU Delft - ImPhys/Pereira group)
L. Siaudynite (VSL Dutch Metrology Institute)
H. Paul Urbach (TU Delft - ImPhys/Adam group)
S. F. Pereira (TU Delft - ImPhys/Pereira group)
O El Gawhary (TU Delft - ImPhys/El Gawhary group)
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Abstract
We demonstrate a broadband implementation of coherent Fourier scatterometry (CFS) using a supercontinuum source. Spectral information can be resolved by splitting the incident field into two pulses with a variable delay and interfering them at the detector after interaction with the sample, bearing similarities with Fourier-transform spectroscopy. By varying the time delay between the pulses, a collection of diffraction patterns is captured in the Fourier plane, thereby obtaining an interferogram for every camera pixel. Spectrally resolved diffraction patterns can then be retrieved with a per-pixel Fourier transform as a function of the delay. We show the physical principle that motivates the two-pulse approach, the experimental realization, and results for a silicon line grating. The presented implementation using a supercontinuum source offers a cost-effective way to acquire multi-wavelength CFS data over a wide wavelength range, with the potential to improve reconstruction robustness and sensitivity in applications such as dimensional metrology.