Is error detection helpful on IBM 5Q chips?

Journal article (2018)

Authors

C. Vuillot QCD/Terhal Group - QuTech Advanced Research Centre , Rheinisch-Westfälische Technische Hochschule
Research Group
QCD/Terhal Group (QuTech Advanced Research Centre) (TU Delft)
Quantum Experiment Fault-tolerance Error detection
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Published Date

2018-9

Language

English

Reuse Rights

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Faculty

QuTech Advanced Research Centre

Department

Quantum Computing Division

Research Group

QCD/Terhal Group

Abstract

This paper reports on experiments realized on several IBM 5Q chips which show evidence for the advantage of using error detection and fault-tolerant design of quantum circuits. We show an average improvement of the task of sampling from states that can be fault-tolerantly prepared in the [[4, 2, 2]] code, when using a fault-tolerant technique well suited to the layout of the chip. By showing that fault-tolerant quantum computation is already within our reach, the author hopes to encourage this approach.