Is error detection helpful on IBM 5Q chips?
Journal Article
(2018)
Author(s)
Christophe Vuillot (RWTH Aachen University, TU Delft - QCD/Terhal Group)
Research Group
QCD/Terhal Group
To reference this document use:
https://resolver.tudelft.nl/uuid:34c75287-a92f-4036-a488-570e9bc6badd
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Publication Year
2018
Language
English
Research Group
QCD/Terhal Group
Issue number
11-12
Volume number
18
Pages (from-to)
949-964
Abstract
This paper reports on experiments realized on several IBM 5Q chips which show evidence for the advantage of using error detection and fault-tolerant design of quantum circuits. We show an average improvement of the task of sampling from states that can be fault-tolerantly prepared in the [[4, 2, 2]] code, when using a fault-tolerant technique well suited to the layout of the chip. By showing that fault-tolerant quantum computation is already within our reach, the author hopes to encourage this approach.
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