The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data
Book Chapter
(2008)
Author(s)
S Van Aert (External organisation)
S Bals (External organisation)
L.Y Chang (External organisation)
AJ den Dekker (TU Delft - Mechanical Engineering)
A.I Kirkland (External organisation)
D Van Dijck (External organisation)
G Van Tendeloo (Universiteit Antwerpen)
Research Group
Team Shengling Shi
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https://resolver.tudelft.nl/uuid:34d7161a-ac56-40e0-80fb-6167973b18ee
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Publication Year
2008
Research Group
Team Shengling Shi
Pages (from-to)
97-98
Publisher
Springer
ISBN (print)
978-3-540-85156-1
Page Views
251
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