Spectra stitching for ultra-high resolution, low sensitivity decay and high-speed SD-OCT
Michael Maria (TU Delft - Structural Integrity & Composites)
Andrei G. Anisimov (TU Delft - Structural Integrity & Composites)
Maartje Stols-Witlox (Universiteit van Amsterdam)
Roger M. Groves (TU Delft - Structural Integrity & Composites)
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Abstract
In this study we investigate the possibility of spectra stitching in the context of Spectral Domain - Optical Coherence Tomography (SD-OCT). The aim is to reach a high axial resolution while keeping sampling issues to a low level (slow decay in depth) but still operating with the fastest camera line rate available. The paper focuses mainly on simulations of spectrometer signals and the stitching procedure. It briefly introduces the experimental system. The findings of this study are relevant to most of the SD-OCT systems and could also be transferred to Swept Source OCT (ß-OCT) where they will help to increase the axial resolution capabilities.