High-reflection microprismatic material as a base for passive reference marks in machine vision metrology applications

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High-reflection microprismatic material as a base for passive reference marks in machine vision metrology applications

Conference Paper (2017)

Author(s)

Anna V. Trushkina (ITMO University)

Aleksandr S. Vasilev (ITMO University)

Mariya G. Serikova (ITMO University)

Andrei G. Anisimov (TU Delft - Structural Integrity & Composites)

Research Group

Structural Integrity & Composites

Machine vision Mark position estimation Microprismatic retrore ective tape Reference mark Retrore ectivity

DOI related publication

https://doi.org/10.1117/12.2269426 Final published version

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https://resolver.tudelft.nl/uuid:36e1bda0-f5cf-48ea-a566-46098fd058c6

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Publication Year

2017

Language

English

Research Group

Structural Integrity & Composites

Volume number

10334

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241

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