Ultra low background cryogenic test facility for far-infrared radiation detectors
Journal Article
(2012)
Author(s)
J.J.A. baselsmans (External organisation)
S. Yates (External organisation)
P Diener (External organisation)
P.J. Visser (TU Delft - QN/Fysics of NanoElectronics)
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:390ad735-b19c-46e8-afdd-69a86fb9754f
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Publication Year
2012
Language
English
Research Group
QN/Fysics of NanoElectronics
Issue number
3-4
Volume number
167
Pages (from-to)
360-366
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