Electrical Characterization of Layer-Exchange Solid-Phase Epitaxy Si Junctions
Conference Paper
(2007)
Author(s)
Y Civale (TU Delft - Electronic Components, Technology and Materials)
R. Mary Joy (External organisation)
L.K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:39884094-7971-4294-855a-dc8a440055b3
More Info
expand_more
expand_more
Publication Year
2007
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-4
No files available
Metadata only record. There are no files for this record.