On the noise limit of stress and temperature measurements with micro-Raman spectroscopy
Journal Article
(2013)
Author(s)
W. Merlijn van Spengen (TU Delft - Micro and Nano Engineering)
JB Roca (External organisation)
Research Group
Micro and Nano Engineering
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Publication Year
2013
Language
English
Research Group
Micro and Nano Engineering
Volume number
44
Pages (from-to)
1039-1044
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