Evaluating the self-heating thermal resistance of bipolar transistors by DC measurements: A critical review and update
Conference Paper
(2009)
Author(s)
S Russo (External organisation)
V d' Alessandro (External organisation)
L La Spina (TU Delft - Electronic Components, Technology and Materials)
N Rinaldi (External organisation)
L.K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:3ace91f0-ac9a-4b14-bf55-9d04d7d6ef51
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Publication Year
2009
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
95-98
ISBN (print)
978-1-4244-4895-1
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