X-ray spectroscopy with a multi-anode sawtooth silicon drift detector: the diffusion process
Journal Article
(2002)
Author(s)
J Sonsky (TU Delft - Old organisation Stralingstechnologie)
RW Hollander (TU Delft - Old organisation Stralingstechnologie)
PM Sarro (TU Delft - Electronic Components, Technology and Materials)
C.W.E. van Eijk (TU Delft - Old organisation Stralingstechnologie)
Department
Old organisation Stralingstechnologie
To reference this document use:
https://resolver.tudelft.nl/uuid:3b992e32-721f-4026-9d02-5fa758a60175
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Publication Year
2002
Department
Old organisation Stralingstechnologie
Volume number
477
Pages (from-to)
93-98
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