High-resolution electron microscopy and electron tomography: resolution versus precision
Journal Article
(2002)
Author(s)
S van Aert (TU Delft - Old - sect Systems, Signals and control Group (IST/MMR))
Arnold J. den Dekker (TU Delft - Old - sect Systems, Signals and control Group (IST/MMR))
D Van Dyck (External organisation)
A van den Bos (TU Delft - Old - sect Systems, Signals and control Group (IST/MMR))
Research Group
Old - sect Systems, Signals and control Group (IST/MMR)
To reference this document use:
https://resolver.tudelft.nl/uuid:3d90bad5-14ec-429e-802d-47db702375bb
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Publication Year
2002
Research Group
Old - sect Systems, Signals and control Group (IST/MMR)
Volume number
138
Pages (from-to)
21-33
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