High-resolution electron microscopy and electron tomography: resolution versus precision

van Aert, S; den Dekker, A.J.; Van Dyck, D; van den Bos, A

High-resolution electron microscopy and electron tomography: resolution versus precision

Journal article (2002)

Authors

S van Aert Old - sect Systems, Signals and control Group (IST/MMR)

A.J. den Dekker Old - sect Systems, Signals and control Group (IST/MMR)

D Van Dyck External organisation

A van den Bos Old - sect Systems, Signals and control Group (IST/MMR)

Research Group

Old - sect Systems, Signals and control Group (IST/MMR)

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Published Date

2002

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Research Group

Old - sect Systems, Signals and control Group (IST/MMR)