Moddeling and Measuring the reflection and transmission of a silicon wafer in the X- and Ka-Bands under illumination of light in a closed waveguide structure
Journal Article
(2001)
Author(s)
M Hajian (External organisation)
SH Heijnen (External organisation)
FH Groen (TU Delft - ImPhys/Optics)
Research Group
ImPhys/Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:3f0393b8-e978-4b8c-8b4a-7a6b9f387724
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Publication Year
2001
Research Group
ImPhys/Optics
Issue number
5
Volume number
31
Pages (from-to)
349-353
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