A Diagnostic Reasoning Approach to Defect Prediction
Conference Paper
(2011)
Author(s)
RF Lima Maranhao De Abreu (TU Delft - Electrical Engineering, Mathematics and Computer Science)
A Gonzalez Sanchez (TU Delft - Electrical Engineering, Mathematics and Computer Science)
AJC van Gemund (TU Delft - Electrical Engineering, Mathematics and Computer Science, TU Delft - Electrical Engineering, Mathematics and Computer Science)
Research Group
Software Engineering
DOI related publication
https://doi.org/10.1007/978-3-642-21827-9_43
Final published version
To reference this document use
https://resolver.tudelft.nl/uuid:479f4c40-83d2-4ae5-a645-f56b3baace3a
More Info
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Publication Year
2011
Language
English
Research Group
Software Engineering
Pages (from-to)
416-425
Publisher
Springer
ISBN (print)
978-3-642-21821-7
Event
IEA/AIE 2011 (2011-06-28 - 2011-07-01), Berlin, Germany
Page Views
185