PIM generation by rough conductors

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PIM generation by rough conductors

Conference Paper (2017)

Author(s)

Paolo Ansuinelli (TU Delft - ImPhys/Optics)

Fabrizio Frezza (Sapienza University of Rome)

Alex Schuchinsky (University of Liverpool)

Research Group

ImPhys/Optics

DOI related publication

https://doi.org/10.1109/iWEM.2017.7968786 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:47dc6410-b3d9-45a7-a344-4a5a3279626d

More Info

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Publication Year

2017

Language

English

Research Group

ImPhys/Optics

Article number

7968786

Pages (from-to)

44-46

ISBN (electronic)

9781509063925

Event

8th International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017 (2017-05-30 - 2017-06-01), London, United Kingdom

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107

Abstract

The effect of conductor surface roughness on electro-thermally (ET) induced passive intermodulation (PIM) products is analysed and discussed. The analytical model combined with the commercial simulator SIMBEOR is used to examine the products of ET nonlinearity, which is significantly influenced by the surface topography of the conductor. It is further shown that, in spite of the rise of ohmic losses with frequency, conductor roughness may somewhat allay the ET-PIM growth due to concurrent increase of additional heat-sinking provided by the interiors of dendrites and conductor cladding.