Interface Characterization and Failure Modeling for Semiconductor Application
Doctoral Thesis
(2012)
Author(s)
A. Xiao (TU Delft - Computational Design and Mechanics)
Research Group
Computational Design and Mechanics
To reference this document use:
https://resolver.tudelft.nl/uuid:49b53c66-1d09-4fb2-929b-f70e27e5b46d
More Info
expand_more
expand_more
Publication Year
2012
Language
English
Research Group
Computational Design and Mechanics
ISBN (print)
978-94-91104-12-1
No files available
Metadata only record. There are no files for this record.