Trade-off between the control bandwith and the measurement accuracy in atomic force microscopy
Conference Paper
(2012)
Author(s)
S. Kuiper (TU Delft - OLD Model-based Measurement & Control)
G Schitter (TU Delft - Mechatronic Systems Design)
Research Group
OLD Model-based Measurement & Control
To reference this document use:
https://resolver.tudelft.nl/uuid:4a881001-c78e-4c40-83dd-7955b031b06b
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Publication Year
2012
Language
English
Research Group
OLD Model-based Measurement & Control
Pages (from-to)
888-893
ISBN (print)
978-1-4577-1772
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