Sensitivity modeling on on-chip interconnect capacitances parasitics extraction for manufacturing variability
Doctoral Thesis
(2012)
Author(s)
Y. Bi (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
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https://resolver.tudelft.nl/uuid:4a8993e0-a099-4976-a89c-f4e713b1f4d9
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Publication Year
2012
Language
English
Research Group
Signal Processing Systems
ISBN (print)
9789461860392
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