Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example

Journal article (2005)

Authors

S van Aert DISC - Mechanical, Maritime and Materials Engineering
A.J. den Dekker DISC - Mechanical, Maritime and Materials Engineering
D Van Dyck External organisation
JH Chen QN/High Resolution Electron Microscopy
Research Group
DISC (Mechanical, Maritime and Materials Engineering) (TU Delft)
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Published Date

2005

Language

Undefined/Unknown

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Faculty

Mechanical, Maritime and Materials Engineering

Department

Delft Center for Systems and Control

Research Group

DISC