Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example
Journal Article
(2005)
Author(s)
S van Aert (TU Delft - DISC)
AJ Den Dekker (TU Delft - DISC)
A van den Bos (ImPhys/Acoustical Wavefield Imaging )
D Van Dyck (External organisation)
JH Chen (TU Delft - QN/High Resolution Electron Microscopy)
Research Group
DISC
To reference this document use:
https://resolver.tudelft.nl/uuid:4c4202d1-f887-4985-89a8-861ae96ff212
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Publication Year
2005
Research Group
DISC
Issue number
2
Volume number
104
Pages (from-to)
107-125
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